=== START OF INFORMATION SECTION ===
Device Model: TOSHIBA HDWJ110
Serial Number: 85B2C8EST
LU WWN Device Id: 5 000039 67338372b
Firmware Version: AX1P1A
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 2.6, 3.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Wed Mar 2 20:36:22 2016 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF ENABLE/DISABLE COMMANDS SECTION ===
SMART Enabled.
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 242) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 1699
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 61
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 73
10 Spin_Retry_Count 0x0033 101 100 030 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 51
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 1
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 1
193 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 4877
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 31 (Min/Max 7/33)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 2343
220 Disk_Shift 0x0002 100 100 000 Old_age Always - 0
222 Loaded_Hours 0x0032 100 100 000 Old_age Always - 53
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0
224 Load_Friction 0x0022 100 100 000 Old_age Always - 0
226 Load-in_Time 0x0026 100 100 000 Old_age Always - 265
240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0
SMART Error Log Version: 1
ATA Error Count: 2345 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 2345 occurred at disk power-on lifetime: 73 hours (3 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 30 3f c7 43 40 Error: ICRC, ABRT at LBA = 0x0043c73f = 4441919
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 30 30 10 c7 43 40 00 00:21:42.488 READ FPDMA QUEUED
25 00 b8 b8 47 2c 40 00 00:21:42.475 READ DMA EXT
25 00 b8 98 f6 2b 40 00 00:21:42.465 READ DMA EXT
25 00 48 30 c5 43 40 00 00:21:42.451 READ DMA EXT
25 00 90 c0 51 2c 40 00 00:21:42.091 READ DMA EXT
Error 2344 occurred at disk power-on lifetime: 73 hours (3 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 e0 47 30 c1 40 Error: ICRC, ABRT at LBA = 0x00c13047 = 12660807
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 18 e0 30 2e c1 40 00 00:19:32.757 READ FPDMA QUEUED
60 08 d8 e8 a4 b8 40 00 00:19:32.748 READ FPDMA QUEUED
60 38 d0 00 8d 43 40 00 00:19:32.743 READ FPDMA QUEUED
60 08 c8 a8 a7 b8 40 00 00:19:32.735 READ FPDMA QUEUED
60 30 c0 f8 7f 43 40 00 00:19:32.734 READ FPDMA QUEUED
Error 2343 occurred at disk power-on lifetime: 73 hours (3 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 28 9f fe dd 40 Error: ICRC, ABRT at LBA = 0x00ddfe9f = 14548639
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 28 a0 fd dd 40 00 00:14:32.760 READ FPDMA QUEUED
60 00 20 a0 fc dd 40 00 00:14:32.760 READ FPDMA QUEUED
60 00 18 a0 fb dd 40 00 00:14:32.760 READ FPDMA QUEUED
60 00 10 a0 fa dd 40 00 00:14:32.760 READ FPDMA QUEUED
60 00 08 a0 f9 dd 40 00 00:14:32.760 READ FPDMA QUEUED
Error 2342 occurred at disk power-on lifetime: 73 hours (3 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 40 9f e3 dd 40 Error: ICRC, ABRT at LBA = 0x00dde39f = 14541727
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 98 a0 ed dd 40 00 00:14:00.320 READ FPDMA QUEUED
60 00 90 a0 ec dd 40 00 00:14:00.320 READ FPDMA QUEUED
60 00 88 a0 eb dd 40 00 00:14:00.320 READ FPDMA QUEUED
60 00 80 a0 ea dd 40 00 00:14:00.320 READ FPDMA QUEUED
60 00 78 a0 e9 dd 40 00 00:14:00.320 READ FPDMA QUEUED
Error 2341 occurred at disk power-on lifetime: 73 hours (3 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 a8 67 c3 65 40 Error: ICRC, ABRT at LBA = 0x0065c367 = 6669159
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 10 a8 58 c3 65 40 00 00:13:59.314 READ FPDMA QUEUED
60 10 a0 28 c3 65 40 00 00:13:59.313 READ FPDMA QUEUED
60 10 98 08 c3 65 40 00 00:13:59.313 READ FPDMA QUEUED
60 10 90 f8 c2 65 40 00 00:13:59.312 READ FPDMA QUEUED
60 10 88 e8 c2 65 40 00 00:13:59.312 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
...Naja egal, ich bin froh das es nur das Kabel ist! Hab schon viel mit meinem alten Mac Book White gebastelt...der seit 2004 noch gut läuft :-D (Screen, Lüfter, Tastatur, Optical getauscht)...das sollte dann hier wohl kein Problem sein...THX auch an die anderen!