root@Microknoppix:/home/knoppix# smartctl -a /dev/sdb
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.16.3-64] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke,
www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Hitachi HTS545032B9A302
Serial Number: 110615PBLC004YG1635X
LU WWN Device Id: 5 000cca 6b5c08b47
Firmware Version: PB3AC60Y
User Capacity: 320.072.933.376 bytes [320 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 5400 rpm
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Thu Nov 5 13:08:14 2015 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 645) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 106) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 086 086 062 Pre-fail Always - 9371688
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 142 142 033 Pre-fail Always - 2
4 Start_Stop_Count 0x0012 097 097 000 Old_age Always - 6233
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 6
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 095 095 000 Old_age Always - 2611
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 097 097 000 Old_age Always - 5528
160 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 1056561954816
192 Power-Off_Retract_Count 0x0032 099 099 000 Old_age Always - 889058492449
193 Load_Cycle_Count 0x0012 081 081 000 Old_age Always - 190559
194 Temperature_Celsius 0x0002 183 183 000 Old_age Always - 30 (Min/Max 11/42)
195 Hardware_ECC_Recovered 0x000a 100 100 000 Old_age Always - 0
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 7
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 26
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0
254 Free_Fall_Sensor 0x0032 089 089 000 Old_age Always - 4294970193
SMART Error Log Version: 1
ATA Error Count: 3308 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 3308 occurred at disk power-on lifetime: 2611 hours (108 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 04 2c 01 00 40 Error: UNC 4 sectors at LBA = 0x0000012c = 300
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d5 08 28 01 00 40 00 00:10:39.800 READ DMA EXT
b0 d5 01 00 4f c2 00 00 00:10:39.800 SMART READ LOG
25 da 08 68 00 00 40 00 00:10:39.800 READ DMA EXT
b0 da 00 00 4f c2 00 00 00:10:39.800 SMART RETURN STATUS
25 d1 08 a8 00 00 40 00 00:10:39.700 READ DMA EXT
Error 3307 occurred at disk power-on lifetime: 2611 hours (108 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 04 2c 00 00 40 Error: UNC 4 sectors at LBA = 0x0000002c = 44
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 28 00 00 40 00 00:10:36.100 READ DMA EXT
ec 00 01 00 00 00 00 00 00:10:36.000 IDENTIFY DEVICE
25 00 08 28 00 00 40 00 00:10:32.400 READ DMA EXT
25 00 08 28 00 00 40 00 00:10:28.700 READ DMA EXT
25 00 08 28 00 00 40 00 00:10:25.100 READ DMA EXT
Error 3306 occurred at disk power-on lifetime: 2611 hours (108 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 04 2c 00 00 40 Error: UNC 4 sectors at LBA = 0x0000002c = 44
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 28 00 00 40 00 00:10:32.400 READ DMA EXT
25 00 08 28 00 00 40 00 00:10:28.700 READ DMA EXT
25 00 08 28 00 00 40 00 00:10:25.100 READ DMA EXT
25 00 08 28 00 00 40 00 00:10:21.400 READ DMA EXT
25 00 08 28 00 00 40 00 00:10:17.700 READ DMA EXT
Error 3305 occurred at disk power-on lifetime: 2611 hours (108 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 04 2c 00 00 40 Error: UNC 4 sectors at LBA = 0x0000002c = 44
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 28 00 00 40 00 00:10:28.700 READ DMA EXT
25 00 08 28 00 00 40 00 00:10:25.100 READ DMA EXT
25 00 08 28 00 00 40 00 00:10:21.400 READ DMA EXT
25 00 08 28 00 00 40 00 00:10:17.700 READ DMA EXT
25 00 08 28 00 00 40 00 00:10:14.100 READ DMA EXT
Error 3304 occurred at disk power-on lifetime: 2611 hours (108 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 04 2c 00 00 40 Error: UNC 4 sectors at LBA = 0x0000002c = 44
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 28 00 00 40 00 00:10:25.100 READ DMA EXT
25 00 08 28 00 00 40 00 00:10:21.400 READ DMA EXT
25 00 08 28 00 00 40 00 00:10:17.700 READ DMA EXT
25 00 08 28 00 00 40 00 00:10:14.100 READ DMA EXT
25 00 08 28 00 00 40 00 00:10:10.400 READ DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
---
Der Test ging sehr schnell und hat nicht lange gedauert, kam mir etwas komisch vor.